Test & Measurement
Power Supply DC- power supplies
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IT-M3100 Ultra-compact Wide Range DC Power Supply
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Features | Five optional cards, providing RS232, CAN, LAN, GPIB, USB_TMC, USB_VCP, RS485, external analog and IO communication interfaces |
| Support CANOPEN, LXI, SCPI and other communication protocols |
| 1U Half-Rack, Ultra-Compact Size |
| Adjustable rising/falling speed of output current, to meet various test applications |
| High speed test, up to 10 times per second |
| Up to 100 steps LIST operation, support output of various dynamic waveforms |
| Support CC/CV loop speed and priority setting |
| Parallel operation can be easily controlled by one unit |
| Independent control of multi- channels, one communication card can control up to 16 channels, max.256 channels |
| Support output of different timings of each channel, can synchronize or delay the output, and supports the output of different ratios of voltage |
| Software watchdog provides more reliable and safe automatic battery test solution |
| Various protection functions such as OVP, ±OCP, ±OPP, OTP, ensure secure testing |
DescriptionIT-M3100 series breaks through the traditional tech limits, in the ultra compact size of only 1U Half-Rack, the unit can not only output high power, but also has high performance and versatility. It supports the master-slave parallel mode. The full range of models support multiple stacking and parallel connection by handily designing "leg" plug-in. Fit with rack mount kit to achieve the perfect use.
IT-M3100 series consists of 12 models, providing 6 voltages grades, and can be combined to achieve a variety of output power. It has a flexible modular architecture, independent multi-channel design, and supports synchronous operation. Users can configure each channel according to the test requirements of DUT, up to max. 16*16 channels, to meet the needs of customized solutions. It has a wide range of application values and is suitable for a variety of applications such as research and development, design verification and automatic test systems intergration.
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